Parametric Test is Done Primarily on Wafers Functional testers test product die Parametric testers sometimes test special structures in the scribe lan
{"Image DocumentName": "Parametric Test is Done Primarily on Wafers", "Image ImageDescription": "Functional testers test product die. Parametric testers sometimes test special structures in the scribe lane. This minimizes the area of a production wafer.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}