Pin Sharing More internal scan chains for faster testing – more test Iopads. Internal Test Scan Input/Output pads are disconnected on the board.
{"Image DocumentName": "Pin SharingMore internal scan chains for faster testing \u2013 more test Iopads. Internal Test Scan Input/Output pads are disconnected on the board.", "Image ImageDescription": "The pads number in the chip is limited. Solution: Share Functional and Test pins. Mode Control. Mode Control. SOUT. SOUT. OUT. IN. OUT. IN. SIN. SIN. ShiftDR. ClockDR. UpdateDR. ShiftDR. ClockDR. UpdateDR. Test Mode. Scan Out.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}